ASAM will once again jointly host the Open Technology Forum at Automotive Testing Expo Europe 2010.
Building on the massive success of last year’s partnership, the organizers of Automotive Testing Expo Europe will join forces with ASAM (Association for Standardisation of Automation and Measuring Systems), to put together a three-day Technology Forum with presentations from leading OEMs and Tier 1 and 2 suppliers.
The Technology Forum is free of charge to attend, and will commence on 22, 23 and 24 June 2010.
View Day 1 | View Day 2 | View Day 3
Day 1 - Tuesday 22 June 2010
Test Automation in Real
and Simulated Environments
10:15
The lingua franca for storing measurement data
Andreas Haub, managing director, National Instruments
Engineering
10:40
Model-based testing for hardware-in-the-loop
Anthony Faucogney, business developer, ALL4TEC
11:05
Increase overall development and test efficiency by
integrating PLM and testing using the example of PTC
Windchill and AVL TFMS
Gerald Sammer, global product manager, AVL List GmbH
11:30
Requirements for standard compliant electrical test
authoring in manufacturing applications
Alfons Schulte, sales manager, DSA Daten- und
Systemtechnik GmbH
11:55
ODX-based testing with OTX
Ralf Ramrath, In2Soft
12:20
ASAM standards and electro-mobility
Jochen Thym, consultant and Frank Müller, business manager
of the Bundesverband eMobilität (BEM eV)
Simulation /Hardware in the Loop
*This program may be subject to change