The organisers of Automotive Testing Expo North America 2017 are now calling for key speakers from all leading OEMs, Tier 1 and Tier 2 manufacturers, suppliers and research institutions at the forefront of the automotive testing, evaluation and quality engineering industry to propose suitable presentations for potential inclusion in the 2017 Open Technology Forum, which will run for three days alongside the exhibition.
Key speakers and presentations are a regular feature at this event. This year presentations must offer an insight into new product design and service innovations and technological developments, or be based on an application story working within one or more of the session categories proposed for discussion below.
Sessions in 2017 will provisionally include:
For further details, contact:
Janet Padgham, Conference Director
Tel: +44 (0) 1306 743744
Fax: +44 (0) 1306 877411